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Contribution of dielectrics to frequency and noise of NbTiN superconducting resonators

Authors :
Barends, R. (author)
Hortensius, H.L. (author)
Zijlstra, T. (author)
Baselmans, J.J.A. (author)
Yates, S.J.C. (author)
Gao, J.R. (author)
Klapwijk, T.M. (author)
Barends, R. (author)
Hortensius, H.L. (author)
Zijlstra, T. (author)
Baselmans, J.J.A. (author)
Yates, S.J.C. (author)
Gao, J.R. (author)
Klapwijk, T.M. (author)
Publication Year :
2008

Abstract

We study NbTiN resonators by measurements of the temperature dependent resonance frequency and frequency noise. Additionally, resonators are studied covered with SiOx dielectric layers of various thicknesses. The resonance frequency develops a nonmonotonic temperature dependence with increasing SiOx layer thickness. The increase in the noise is independent of the SiOx thickness, demonstrating that the noise is not dominantly related to the low temperature resonance frequency deviations.<br />Kavli Institute of Nanoscience<br />Applied Sciences

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1008824308
Document Type :
Electronic Resource
Full Text :
https://doi.org/10.1063.1.2937837