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Observation of strain-relaxation-induced size effects in p-type Si/SiGe resonant-tunneling diodes

Observation of strain-relaxation-induced size effects in p-type Si/SiGe resonant-tunneling diodes

Authors :
Lukey, P.W. (author)
Caro, J. (author)
Zijlstra, T. (author)
van der Drift, E. (author)
Radelaar, S. (author)
Lukey, P.W. (author)
Caro, J. (author)
Zijlstra, T. (author)
van der Drift, E. (author)
Radelaar, S. (author)
Publication Year :
1998

Details

Database :
OAIster
Notes :
English
Publication Type :
Electronic Resource
Accession number :
edsoai.on1008816018
Document Type :
Electronic Resource

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