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Refueling: Preventing wire degradation due to electromigration
- Publication Year :
- 2008
-
Abstract
- Electromigration is a major source of wire and via failure. Refueling undoes EM for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits EM's self-healing effect by balancing the amount of current flowing in both directions of a wire. It can significantly extend a wire's lifetime while reducing the chip area devoted to wires.<br />Peer Reviewed<br />Postprint (published version)
Details
- Database :
- OAIster
- Notes :
- 10 p., application/pdf, English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.ocn978332181
- Document Type :
- Electronic Resource