Intrinsic quality factor of electromagnetic oscillations in half-open waveguide junctions with dielectric

This paper is an extension of a series of works devoted to inquiries in physics of resonant phenomena in waveguide junctions of different cross-section [1–6] and to their usage for measurement of electric characteristics of materials [6, 8, 10]. The work includes electrodynamic and numerical analysis of intrinsic Q-factors of H-type electromagnetic oscillation (having the largest Q value) in a cylindrical-rectangular waveguide junction filled with dielectric. The comparative characteristic of intrinsic Q-factors of waveguide junctions of different cross-sections is given—cylindrical-radial, rectangular-rectangular, and cylindrical-rectangular waveguides. Also, the paper contains recommendations on proper selection of waveguide junctions for measurement of dielectric loss of certain materials.