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Imaging cervical cytology with scanning near-field optical microscopy (SNOM) coupled with an IR-FEL

Authors :
Halliwell, Diane
Medeiros-De-morais, Camilo De lelis
Lima, Kassio Michell Gomes De
Trevisan, Julio
Siggel-King, Michele R. F.
Craig, Tim
Ingham, James
Martin, David S.
Heys, Kelly
Kyrgiou, Maria
Mitra, Anita
Paraskevaidis, Evangelos
Theophilou, Georgios
Martin-Hirsch, Pierre Leonard
Cricenti, Antonio
Luce, Marco
Weightman, Peter
Martin, Francis L
Halliwell, Diane
Medeiros-De-morais, Camilo De lelis
Lima, Kassio Michell Gomes De
Trevisan, Julio
Siggel-King, Michele R. F.
Craig, Tim
Ingham, James
Martin, David S.
Heys, Kelly
Kyrgiou, Maria
Mitra, Anita
Paraskevaidis, Evangelos
Theophilou, Georgios
Martin-Hirsch, Pierre Leonard
Cricenti, Antonio
Luce, Marco
Weightman, Peter
Martin, Francis L
Publication Year :
2016

Abstract

Cervical cancer remains a major cause of morbidity and mortality among women, especially in the developing world. Increased synthesis of proteins, lipids and nucleic acids is a pre-condition for the rapid proliferation of cancer cells. We show that scanning near-field optical microscopy, in combination with an infrared free electron laser (SNOM-IR-FEL), is able to distinguish between normal and squamous low-grade and high-grade dyskaryosis, and between normal and mixed squamous/glandular pre-invasive and adenocarcinoma cervical lesions, at designated wavelengths associated with DNA, Amide I/II and lipids. These findings evidence the promise of the SNOM-IR-FEL technique in obtaining chemical information relevant to the detection of cervical cell abnormalities and cancer diagnosis at spatial resolutions below the diffraction limit (?0.2 \ensuremathμm). We compare these results with analyses following attenuated total reflection Fourier-transform infrared (ATR-FTIR) spectroscopy; although this latter approach has been demonstrated to detect underlying cervical atypia missed by conventional cytology, it is limited by a spatial resolution of ~3 \ensuremathμm to 30 \ensuremathμm due to the optical diffraction limit.

Details

Database :
OAIster
Notes :
application/pdf, English
Publication Type :
Electronic Resource
Accession number :
edsoai.ocn968934878
Document Type :
Electronic Resource