Back to Search Start Over

Alpha-decay damage and recrystallization in zircon: evidence for an intermediate state from infrared spectroscopy

Authors :
Department of Nuclear Engineering and Radiological Sciences, Department of Geological Sciences, University of Michigan, Ann Arbor, MI 48109-22104, USA
Department of Earth Sciences, University of Cambridge, Downing Street, Cambridge CB2 3EQ, UK
Mineralogisches Museum, Mineralogisch-Petrographisches Institut, Universit??t Hamburg, Grindelallee 48, D-20146 Hamburg, Germany
Ann Arbor
Zhang, M.
Salje, Ekhard K.H.
Ewing, Rodney C
Farnan, Ian
R??os, S.
Schl??ter, Jochen
Leggo, P.
Department of Nuclear Engineering and Radiological Sciences, Department of Geological Sciences, University of Michigan, Ann Arbor, MI 48109-22104, USA
Department of Earth Sciences, University of Cambridge, Downing Street, Cambridge CB2 3EQ, UK
Mineralogisches Museum, Mineralogisch-Petrographisches Institut, Universit??t Hamburg, Grindelallee 48, D-20146 Hamburg, Germany
Ann Arbor
Zhang, M.
Salje, Ekhard K.H.
Ewing, Rodney C
Farnan, Ian
R??os, S.
Schl??ter, Jochen
Leggo, P.
Publication Year :
2006

Abstract

??-decay damage and recrystallization in natural zircon (with dose ranging from 0.06 to 23.3??1018??-events??g -1) were studied using polarized reflection infrared spectroscopy. The experimental results show that??-decay damage leads to a gradual decrease in reflectivity and a loss of anisotropy of IR spectra. Recrystallization of damaged zircon is found as a multi-stage process with a strong dependence on the initial degree of damage. In weakly and moderately damaged samples the major recrystallization takes place near 1000??K. Annealed samples recrystallize epitaxially along their original crystallographic orientations. A highly damaged zircon with radiation dose of 15.9??1018??-events??g -1 decomposes into SiO2 and ZrO2 near 1100??K. In this sample the growth of ZrSiO4 from the binary oxides occurs between 1400 and 1500??K. An additional IR signal peaked near 790??cm -1 is detected in moderately damaged samples annealed at temperatures higher than 800??K. This peak is sharp and isotropic. The peak tends to disappear at temperatures above 1400??K. This signal may be related to an unknown intermediate phase caused by heating of radiation-damaged zircon. Alternatively, the signal may be due to the structural distortions near the boundaries between the amorphized and crystalline regions.

Details

Database :
OAIster
Notes :
En_US
Publication Type :
Electronic Resource
Accession number :
edsoai.ocn907520311
Document Type :
Electronic Resource