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Impact of Progressive Soft Oxide Breakdown on MOS Parameters: Experiment and Modelling.

Details

Database :
OAIster
Journal :
15th Workshop on Dielectrics in Microelectronics, Berlin, Germany; 15th Workshop on Dielectrics in Microelectronics, Berlin, Germany, Jun 2008, France
Notes :
15th Workshop on Dielectrics in Microelectronics, Berlin, Germany, English
Publication Type :
Electronic Resource
Accession number :
edsoai.ocn893169389
Document Type :
Electronic Resource