Refined characterization up to millimeter waves of ferroelectric KTN thin film for efficient integrated tunable devices

Authors :: RFHO ; Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC) ; Université de Savoie - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG) - CNRS - Université de Savoie - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG) - CNRS
Houzet, G.
Lacrevaz, T.
Bermond, C.
Le Febvrier, A.
Deputier, S.
Guilloux-Viry, M.
Queffelec, P.
Flechet, B.
RFHO ; Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC) ; Université de Savoie - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG) - CNRS - Université de Savoie - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG) - CNRS
Houzet, G.
Lacrevaz, T.
Bermond, C.
Le Febvrier, A.
Deputier, S.
Guilloux-Viry, M.
Queffelec, P.
Flechet, B.
Source :: 224th ECS Meeting; 224th ECS Meeting, Oct 2013, San Francisco, United States. pp.1-4
Abstract: International audience<br />"", , Oct. 27 - Nov. 1, 2013, San Francisco, USA

Database :: OAIster
Journal :: 224th ECS Meeting; 224th ECS Meeting, Oct 2013, San Francisco, United States. pp.1-4
Notes :: San Francisco, United States, 224th ECS Meeting, English
Publication Type :: Electronic Resource
Accession number :: edsoai.ocn893125117
Document Type :: Electronic Resource

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