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Automatic generation algorithms, experiments and comparisons of self-checking PLA schemes using parity codes

Authors :
Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) ; CNRS - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG)
iROc Technologies (IROC TECHNOLOGIES) ; Cadence Connection - EDA Consortium - FSA - Cubic Micro
Boudjit, M.
Nicolaidis, M.
Torki, K.
Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA) ; CNRS - Université Joseph Fourier - Grenoble I - Institut National Polytechnique de Grenoble (INPG)
iROc Technologies (IROC TECHNOLOGIES) ; Cadence Connection - EDA Consortium - FSA - Cubic Micro
Boudjit, M.
Nicolaidis, M.
Torki, K.
Source :
[1993]-Proceedings-The-European-Conference-on-Design-Automation-with-the-European-Event-in-ASIC-Design. Feb.; [1993]-Proceedings-The-European-Conference-on-Design-Automation-with-the-European-Event-in-ASIC-Design. Feb., Dec 1992, Paris, France. IEEE Computer Society Press, Los Alamitos, CA, USA, pp.144-50, <10.1109/EDAC.1993.386485>

Abstract

ISBN: 0818634103&lt;br /&gt;Self-checking circuits ensure concurrent error detection by means of hardware redundancy. An important drawback of self-checking circuits is that they involve a significant increasing of the circuit area. Recent experiments on Berger-code encoded PLAs result on 46.9% average area overhead. In order to decrease this overhead, the authors present a tool that generates self-checking PLAs using parity encoding for the product terms and the outputs. This tool has been used for experimenting on several benchmark PLAs. In these experiments the authors retain for each PLA case the scheme involving the lower area overhead. Thus the mean overhead is reduced from 46.9% [TCR 91] to 37.2% (24.9% if a PLA named misex3 is not included).

Details

Database :
OAIster
Journal :
[1993]-Proceedings-The-European-Conference-on-Design-Automation-with-the-European-Event-in-ASIC-Design. Feb.; [1993]-Proceedings-The-European-Conference-on-Design-Automation-with-the-European-Event-in-ASIC-Design. Feb., Dec 1992, Paris, France. IEEE Computer Society Press, Los Alamitos, CA, USA, pp.144-50, <10.1109/EDAC.1993.386485>
Notes :
Paris, France, [1993]-Proceedings-The-European-Conference-on-Design-Automation-with-the-European-Event-in-ASIC-Design. Feb., English
Publication Type :
Electronic Resource
Accession number :
edsoai.ocn892987293
Document Type :
Electronic Resource