Cite
Special Techniques for the Auger Analysis of Microelectronic Devices.
MLA
Aerospace Corp El Segundo Ca Lab Operations, et al. “Special Techniques for the Auger Analysis of Microelectronic Devices.” DTIC AND NTIS, 1986. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.ocn834231006&authtype=sso&custid=ns315887.
APA
Aerospace Corp El Segundo Ca Lab Operations, Leung, M. S., & Stupian, G. W. (1986). Special Techniques for the Auger Analysis of Microelectronic Devices. DTIC AND NTIS.
Chicago
Aerospace Corp El Segundo Ca Lab Operations, M S Leung, and G W Stupian. 1986. “Special Techniques for the Auger Analysis of Microelectronic Devices.” DTIC AND NTIS. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsoai&AN=edsoai.ocn834231006&authtype=sso&custid=ns315887.