Back to Search
Start Over
Functional Testing of LSI/VLSI Based Systems with Measure of Fault Coverage.
- Source :
- DTIC AND NTIS
- Publication Year :
- 1983
-
Abstract
- This paper presents a number of algorithms to test the instruction decoding function of microprocessors based on some timing and control information available to users. Keywords: Register Transfer Language; Digital Networks.
Details
- Database :
- OAIster
- Journal :
- DTIC AND NTIS
- Notes :
- text/html, English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.ocn831842057
- Document Type :
- Electronic Resource