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Monitors for Upset Detection in Computer Systems

Authors :
JOHNS HOPKINS UNIV LAUREL MD APPLIED PHYSICS LAB
Schmid,M. E.
Trapp,R. L.
Masson,G. M.
Davidoff,A. E.
JOHNS HOPKINS UNIV LAUREL MD APPLIED PHYSICS LAB
Schmid,M. E.
Trapp,R. L.
Masson,G. M.
Davidoff,A. E.
Source :
DTIC AND NTIS
Publication Year :
1983

Abstract

An upset is a deviation of system performance based on apriori knowledge of the system application task. There has heretofore been little experimental work reported in the literature regarding characterizations of upsets in computer systems. This problem was addressed in the research reported in this paper with two series of fault injection experiments on a representative microprocessor-based system. In the first series, the system executes a small machine language program; in the second series, a much larger software environment consisting of a Pascal interpreter running a general applications program is used. For each case, a broad spectrum of fault conditions is utilized for the fault injections. An extensive instrumentation complex has been developed to record microevent data associated with the upsets resulting from the injections. This data is used to characterize upsets in computer-based systems. It also serves as a benchmark for the performance of candidate upset monitors in the sense that coverage and latency figures for such devices can be deduced from this data. (Author)<br />This article is from 'International Aerospace and Ground Conference on Lightning and Static Electricity (8th): 'Lightning Technology Roundup,' held at Fort Worth, Texas on 21-23 June 1983,' AD-A135 100, p78-1 thru 78-15.

Details

Database :
OAIster
Journal :
DTIC AND NTIS
Notes :
text/html, English
Publication Type :
Electronic Resource
Accession number :
edsoai.ocn831621492
Document Type :
Electronic Resource