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A GaAs metalorganic vapor phase epitaxy growth process o reduce Ge out-diffusion from the Ge substrate
- Source :
- Applied Physics Letters, ISSN 0003-6951, 2008-04, Vol. 92, No. 15
- Publication Year :
- 2008
-
Abstract
- A barrier based on GaAs for controlling the Ge out diffusion has been developed by metalorganic vapor phase epitaxy. It is based on a thin GaAs layer (50 nm) grown at a low temperature (≈500 °C) on top of a predeposition layer, showing that GaAs prevents the Ge diffusing when it is grown at a low temperature. Additionally, two different predeposition monolayers have been compared, concluding that when the Ga is deposited first, the diffusions across the GaAsGe heterointerface decrease.
Details
- Database :
- OAIster
- Journal :
- Applied Physics Letters, ISSN 0003-6951, 2008-04, Vol. 92, No. 15
- Notes :
- application/pdf, English
- Publication Type :
- Electronic Resource
- Accession number :
- edsoai.ocn778042952
- Document Type :
- Electronic Resource