Local electronic transport through a junction of SWNT bundles

We have measured local electronic transport through a junction of single-wall carbon nanotube (SWNT) bundles by Atomic force microscopy (AFM)/Scanning tunneling spectroscopy (STS) dual probe method. We found that 1) the sudden decrease in current near the junction of SWNT bundles 2) the current actually flow through the junction of SWNT bundles. From the observed topographic current image, we can expect our method will be a powerful technique for investigation of functions of the devices in the nanometer scale.