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Robust Morphological Measures for Large-Scale Structure

Authors :
Buchert, T.
Buchert, T.
Publication Year :
1994

Abstract

A complete family of statistical descriptors for the morphology of large--scale structure based on Minkowski--Functionals is presented. These robust and significant measures can be used to characterize the local and global morphology of spatial patterns formed by a coverage of point sets which represent galaxy samples. Basic properties of these measures are highlighted and their relation to the `genus statistics' is discussed. Test models like a Poissonian point process and samples generated from a Voronoi--model are put into perspective.<br />Comment: 8 pages, uuencoded compressed ps-file, 1 MByte

Details

Database :
OAIster
Publication Type :
Electronic Resource
Accession number :
edsoai.ocn691228346
Document Type :
Electronic Resource