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STUDY OF EFFECT OF HIGH-INTENSITY PULSED NUCLEAR RADIATION ON ELECTRONIC PARTS AND MATERIALS (SCORRE).

Authors :
IBM FEDERAL SYSTEMS DIV OWEGO NY ELECTRONICS SYSTEMS CENTER
Frankovsky, Frank A.
IBM FEDERAL SYSTEMS DIV OWEGO NY ELECTRONICS SYSTEMS CENTER
Frankovsky, Frank A.
Source :
DTIC AND NTIS
Publication Year :
1966

Abstract

A series of radiation tests has been completed on several dielectrics and magnetics at the White Sands Linear Accelerator (LINAC) Facility. Capacitors were tested at applied voltages ranging from zero to the rated values. Current probes were used to measure the induced current and replenishment charge.

Details

Database :
OAIster
Journal :
DTIC AND NTIS
Notes :
text/html, English
Publication Type :
Electronic Resource
Accession number :
edsoai.ocn669561278
Document Type :
Electronic Resource