Back to Search
Start Over
Heavy ion induced soft breakdown of thin gate oxides
- Publication Year :
- 2001
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 2001.
-
Abstract
- Heavy ion induced soft and hard breakdown are investigated in thin gate oxides as a function of LET, fluence, and voltage applied during irradiation. It is found that post-irradiation oxide conduction is well described by the Sune quantum point contact model.
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Publication Type :
- Report
- Accession number :
- edsnas.20210002176
- Document Type :
- Report