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NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results

Authors :
Alyson D. Topper
Jean-Marie Lauenstein
Edward P. Wilcox
Melanie D. Berg
Michael J. Campola
Megan C. Casey
Edward J. Wyrwas
Martha V. O’Bryan
Thomas A. Carstens
Caroline M. Fedele
James D. Forney
Hak S. Kim
Jason M. Osheroff
Anthony M. Phan
Max F. Chaiken
Donna J. Cochran
Jonathan A. Pellish
Peter J. Majewicz
Source :
Presentation only (no video) for posting on public website https://radhome.nasa.gov.
Publication Year :
2020
Publisher :
United States: NASA Center for Aerospace Information (CASI), 2020.

Abstract

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.

Details

Language :
English
Database :
NASA Technical Reports
Journal :
Presentation only (no video) for posting on public website https://radhome.nasa.gov
Notes :
80GSFC18C0120, , 724297.40.49.04.01
Publication Type :
Report
Accession number :
edsnas.20205009313
Document Type :
Report