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A New Approach to System-Level Single Event Survivability Prediction

Authors :
Berg, Melanie
LaBel, Kenneth
Campola, Michael
Xapsos, Michael
Publication Year :
2018
Publisher :
United States: NASA Center for Aerospace Information (CASI), 2018.

Abstract

We are investigating the application of classical reliability performance metrics combined with standard single event upset (SEU) analysis data to improve system survivability prediction.

Subjects

Subjects :
Electronics And Electrical Engineering

Details

Language :
English
Database :
NASA Technical Reports
Notes :
NNG13CR48C
Publication Type :
Report
Accession number :
edsnas.20190002701
Document Type :
Report

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