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Effects of Bias, Electrical and Thermal Stress on DDR2 Total Ionizing Dose Response
- Publication Year :
- 2012
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 2012.
-
Abstract
- We investigate whether bias conditions arid electrical and thermal stresses can affect the Total Ionizing Dose response ofDDR2 SDRAMs
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Publication Type :
- Report
- Accession number :
- edsnas.20180001171
- Document Type :
- Report