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Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion Laboratory

Authors :
Miyahira, Tetsuo F
Irom, Farokh
Publication Year :
2008
Publisher :
United States: NASA Center for Aerospace Information (CASI), 2008.

Abstract

This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.

Details

Language :
English
Database :
NASA Technical Reports
Publication Type :
Report
Accession number :
edsnas.20150008624
Document Type :
Report