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Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion Laboratory
- Publication Year :
- 2008
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 2008.
-
Abstract
- This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.
- Subjects :
- Electronics And Electrical Engineering
Subjects
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Publication Type :
- Report
- Accession number :
- edsnas.20150008624
- Document Type :
- Report