Back to Search
Start Over
Delta-Doping at Wafer Level for High Throughput, High Yield Fabrication of Silicon Imaging Arrays
- Publication Year :
- 2014
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 2014.
-
Abstract
- Systems and methods for producing high quantum efficiency silicon devices. A silicon MBE has a preparation chamber that provides for cleaning silicon surfaces using an oxygen plasma to remove impurities and a gaseous (dry) NH3 + NF3 room temperature oxide removal process that leaves the silicon surface hydrogen terminated. Silicon wafers up to 8 inches in diameter have devices that can be fabricated using the cleaning procedures and MBE processing, including delta doping.
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Publication Type :
- Report
- Accession number :
- edsnas.20150003411
- Document Type :
- Report