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Delta-Doping at Wafer Level for High Throughput, High Yield Fabrication of Silicon Imaging Arrays

Authors :
Hoenk, Michael E
Nikzad, Shoulch
Jones, Todd J
Greer, Frank
Carver, Alexander G
Publication Year :
2014
Publisher :
United States: NASA Center for Aerospace Information (CASI), 2014.

Abstract

Systems and methods for producing high quantum efficiency silicon devices. A silicon MBE has a preparation chamber that provides for cleaning silicon surfaces using an oxygen plasma to remove impurities and a gaseous (dry) NH3 + NF3 room temperature oxide removal process that leaves the silicon surface hydrogen terminated. Silicon wafers up to 8 inches in diameter have devices that can be fabricated using the cleaning procedures and MBE processing, including delta doping.

Details

Language :
English
Database :
NASA Technical Reports
Publication Type :
Report
Accession number :
edsnas.20150003411
Document Type :
Report