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Uncertainty Analysis of Seebeck Coefficient and Electrical Resistivity Characterization

Authors :
Mackey, Jon
Sehirlioglu, Alp
Dynys, Fred
Publication Year :
2014
Publisher :
United States: NASA Center for Aerospace Information (CASI), 2014.

Abstract

In order to provide a complete description of a materials thermoelectric power factor, in addition to the measured nominal value, an uncertainty interval is required. The uncertainty may contain sources of measurement error including systematic bias error and precision error of a statistical nature. The work focuses specifically on the popular ZEM-3 (Ulvac Technologies) measurement system, but the methods apply to any measurement system. The analysis accounts for sources of systematic error including sample preparation tolerance, measurement probe placement, thermocouple cold-finger effect, and measurement parameters; in addition to including uncertainty of a statistical nature. Complete uncertainty analysis of a measurement system allows for more reliable comparison of measurement data between laboratories.

Details

Language :
English
Database :
NASA Technical Reports
Notes :
WBS 138494.04.02.01, , NNC13BA10B, , NNX08AB43A
Publication Type :
Report
Accession number :
edsnas.20140012564
Document Type :
Report