Back to Search
Start Over
Radiation induced degradation of SOI n-channel LDMOSFETs
- Publication Year :
- 2001
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 2001.
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Publication Type :
- Report
- Accession number :
- edsnas.20060039819
- Document Type :
- Report