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Current Single Event Effects and Radiation Damage Results for Candidate Spacecraft Electronics

Authors :
OBryan, Martha V
LaBel, Kenneth A
Reed, Robert A
Ladbury, Ray L
Howard, James W., Jr
Kniffin, Scott D
Poivey, Christian
Buchner, Stephen P
Bings, John P
Titus, Jeff L
Publication Year :
2002
Publisher :
United States: NASA Center for Aerospace Information (CASI), 2002.

Abstract

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, total ionizing dose and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.

Details

Language :
English
Database :
NASA Technical Reports
Notes :
DTRA-IACRO-01-4050/0001278
Publication Type :
Report
Accession number :
edsnas.20030025415
Document Type :
Report