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Wafer level reliability testing: An idea whose time has come
- Source :
- NASA. Langley Research Center, Electronics Reliability and Measurement Technology.
- Publication Year :
- 1987
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 1987.
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Abstract
- Wafer level reliability testing has been nurtured in the DARPA supported workshops, held each autumn since 1982. The seeds planted in 1982 have produced an active crop of very large scale integration manufacturers applying wafer level reliability test methods. Computer Aided Reliability (CAR) is a new seed being nurtured. Users are now being awakened by the huge economic value of the wafer reliability testing technology.
- Subjects :
- Quality Assurance And Reliability
Subjects
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Journal :
- NASA. Langley Research Center, Electronics Reliability and Measurement Technology
- Publication Type :
- Report
- Accession number :
- edsnas.19870017776
- Document Type :
- Report