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Determining Optical Axes of Uniaxial Crystals

Authors :
Schock, H. J
Regan, C. A
Lock, J. A
Source :
NASA Tech Briefs. 11(2)
Publication Year :
1987
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1987.

Abstract

Polarizing-microscope concept adapted for thick samples. Optical axis of crystal usually found by examining sample thinner than 1 mm between crossed polarizing plates. Frequently impractical to cut off small sample of crystal for testing, technique modified to accommodate large crystals. Ability to circumvent effect of birefringence has applications where laser beams must be transmitted through uniaxial crystals, as in laser diagnostics of contained flows in systems requiring windows for optical access.

Subjects

Subjects :
Physical Sciences

Details

Language :
English
ISSN :
0145319X
Volume :
11
Issue :
2
Database :
NASA Technical Reports
Journal :
NASA Tech Briefs
Publication Type :
Report
Accession number :
edsnas.19870000063
Document Type :
Report