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Seebeck Coefficient Measured With Differential Heat Pulses
- Source :
- NASA Tech Briefs. 10(1)
- Publication Year :
- 1986
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 1986.
-
Abstract
- Common experimental errors reduced because pulse technique suppresses drifts in thermoelectric measurements. Differential-heat-pulse apparatus measures Seebeck coefficient in semiconductors at temperatures up to 1,900 K. Sample heated to measuring temperature in furnace. Ends of sample then differentially heated a few degrees more by lamps. Differential temperature rise and consequent Seebeck voltage measured via thermocouple leads. Because pulse technique used, errors that often arise from long-term drifts in thermoelectric measurements suppressed. Apparatus works with temperature differences of only few degrees, further increasing accuracy of coefficients obtained.
- Subjects :
- Physical Sciences
Subjects
Details
- Language :
- English
- ISSN :
- 0145319X
- Volume :
- 10
- Issue :
- 1
- Database :
- NASA Technical Reports
- Journal :
- NASA Tech Briefs
- Publication Type :
- Report
- Accession number :
- edsnas.19860000029
- Document Type :
- Report