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Measurement of Seebeck coefficient using a light pulse
- Source :
- Review of Scientific Instruments. 56
- Publication Year :
- 1985
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 1985.
-
Abstract
- A high-temperature (1900 K) Seebeck coefficient apparatus is described in which small thermal gradients are generated in a sample by light pulses transmitted via light pipes. By employing an analog subtraction circuit, the Seebeck coefficient is displayed directly on an X-Y recorder. This technique presents a convenient, accurate, and rapid method for measuring the Seebeck coefficient in highly doped semiconductors as a function of temperature. The nature of the resulting display (X-Y recording) is a valuable tool in determining validity of the data. A straight line results (i.e., a minimum of hysteresis) only if all potential experimental errors are minimized. Under these conditions, the error of measurements of the Seebeck coefficient is estimated to be less than + or - 1 percent.
- Subjects :
- Instrumentation And Photography
Subjects
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 56
- Database :
- NASA Technical Reports
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Report
- Accession number :
- edsnas.19850055066
- Document Type :
- Report
- Full Text :
- https://doi.org/10.1063/1.1138213