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Sputtering of the gallium-indium eutectic alloy in the liquid phase

Authors :
Dumke, M. F
Tombrello, T. A
Weller, R. A
Housley, R. M
Cirlin, E. H
Source :
Surface Science. 124
Publication Year :
1983
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1983.

Abstract

Watson and Haff (1980) have discussed a theory which is designed to explain quantitatively isotopic fractionation effects observed during sputtering of simple or complex targets. This theory is based on the assumption that most of the atoms sputtered from a surface originate in the top monolayer. The present investigation is mainly concerned with a direct experimental test of that assumption. The sputtering of both solid and liquid phases of gallium, indium, and the gallium-indium eutectic alloy is studied. Results obtained with the aid of ion scattering and Auger spectroscopy show that, in agreement with rough theoretical expectations, the surface monolayer of a gallium-indium alloy with 16.5 percent indium in bulk contains more than 94 percent indium, while the next layer can be only slightly enriched.

Subjects

Subjects :
Solid-State Physics

Details

Language :
English
ISSN :
00396028
Volume :
124
Database :
NASA Technical Reports
Journal :
Surface Science
Notes :
NAGW-148, , NAGW-202, , DE-AC02-76ER-03074, , NSF CHE-81-13272, , NAS9-11539, , NSF PHY-79-23638
Publication Type :
Report
Accession number :
edsnas.19840037760
Document Type :
Report
Full Text :
https://doi.org/10.1016/0039-6028(83)90800-2