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Evaluation of charge control techniques on spacecraft thermal surfaces (electrostatic discharge study)

Authors :
Robinson, P. A., Jr
Brown, E. M
Conan, S. M
Dulgeroff, C. R
Elkman, W. R
Holm, G. J
Lawton, L. C
Pack, G. J
Shannon, D. L
Source :
NASA. Lewis Research Center Spacecraft Charging Technol., 1980.
Publication Year :
1980
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1980.

Abstract

The charging and discharging characteristics of various dielectric materials commonly used on spacecraft were tested. The experimental apparatus and the calculations used to analyze the data generated during the testing are described. The test technique, results, and analysis used are presented. Indium tin oxide coated Teflon, Kapton, and quartz do not charge significantly. CTL 15 white paint shows no large charge build up. Pinholes in Teflon and Kapton increase the leakage through the sample and reduce the energy released in an arc. Conductive grids in Teflon and Kapton reduce the arc energy by two orders of magnitude over untreated samples. Extreme low temperatures (-195 C) do not significantly increase the arc energy of the gridded sample.

Details

Language :
English
Database :
NASA Technical Reports
Journal :
NASA. Lewis Research Center Spacecraft Charging Technol., 1980
Publication Type :
Report
Accession number :
edsnas.19820006362
Document Type :
Report