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Optical integrated-circuit tester
- Source :
- NASA Tech Briefs. 2(1)
- Publication Year :
- 1977
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 1977.
-
Abstract
- Computer controlled device can check typical medium scale unit in less than one minute. System scans integrated circuit chip with narrow beam of light while simultaneously scanning reference chip.
- Subjects :
- Mechanics
Subjects
Details
- Language :
- English
- ISSN :
- 0145319X
- Volume :
- 2
- Issue :
- 1
- Database :
- NASA Technical Reports
- Journal :
- NASA Tech Briefs
- Publication Type :
- Report
- Accession number :
- edsnas.19770000098
- Document Type :
- Report