Back to Search Start Over

Surface profilometer for examining grain-boundary grooves

Authors :
Jech, R. E
Ready, D. W
Publication Year :
1969
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1969.

Abstract

Surface profilometer, consisting primarily of commercially available components, measures surface topographical features accurately and precisely. It shows improvement over the interferometric technique in measurement of grain-boundary grooves formed during annealing on nickel-oxide bicrystals.

Subjects

Subjects :
Mechanics

Details

Language :
English
Database :
NASA Technical Reports
Publication Type :
Report
Accession number :
edsnas.19690000344
Document Type :
Report

Tools

Authors Abstract Subjects Details