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Development of biaxial test fixture includes cryogenic application
- Publication Year :
- 1968
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 1968.
-
Abstract
- Test fixture has the capability of producing biaxial stress fields in test specimens to the point of failure. It determines biaxial stress by dividing the applied load by the net cross section. With modification it can evaluate materials, design concepts, and production hardware at cryogenic temperatures.
- Subjects :
- Electronic Components And Circuits
Subjects
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Publication Type :
- Report
- Accession number :
- edsnas.19680000070
- Document Type :
- Report