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Microinhomogeneity problems in silicon.
- Source :
- IEEE TRANSACTIONS ON PARTS.
- Publication Year :
- 1966
- Publisher :
- United States: NASA Center for Aerospace Information (CASI), 1966.
-
Abstract
- Electron microscopy analysis of microinhomogeneities in commercial Si used in preparation of p-n junction devices
- Subjects :
- Materials, Nonmetallic
Subjects
Details
- Language :
- English
- Database :
- NASA Technical Reports
- Journal :
- IEEE TRANSACTIONS ON PARTS
- Notes :
- NAS8-11432
- Publication Type :
- Report
- Accession number :
- edsnas.19670033705
- Document Type :
- Report