Back to Search Start Over

SiO2/Si interface states at 77 deg K

Authors :
Caban-Zeda, H. P
Greenstein, E
Kuper, A. B
Publication Year :
1967
Publisher :
United States: NASA Center for Aerospace Information (CASI), 1967.

Abstract

Silicon oxide-silicon interface states at 77 degrees K

Subjects

Subjects :
Physics, Solid-State

Details

Language :
English
Database :
NASA Technical Reports
Notes :
NGR-36-003-067
Publication Type :
Report
Accession number :
edsnas.19670030532
Document Type :
Report

Tools

Authors Abstract Subjects Details