One-micron process ups complexity of gauging ASIC performance

Subjects

Subjects :

Application-Specific Integrated Circuit
Circuit Design
Packaging Density
Semiconductor Production Equipment
New Technique
Gate Arrays
VLSI Technology Inc. -- Innovations
LSI Corp. -- Innovations
Motorola Inc. -- Innovations

Details

ISSN :

00104566

Volume :

v28

Issue :

n3

Database :

Gale General OneFile

Journal :

Computer Design

Publication Type :

Academic Journal

Accession number :

edsgcl.9821025