X-ray absolute calibration of the time response of a silicon photodiode

MLA

Seely, John F., et al. “X-Ray Absolute Calibration of the Time Response of a Silicon Photodiode.” Applied Optics, vol. 41, no. 25, Sept. 2002, p. 5209. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.91211001&authtype=sso&custid=ns315887.

APA

Seely, J. F., Boyer, C. N., Holland, G. E., & Weaver, J. L. (2002). X-ray absolute calibration of the time response of a silicon photodiode. Applied Optics, 41(25), 5209.

Chicago

Seely, John F., Craig N. Boyer, Glenn E. Holland, and James L. Weaver. 2002. “X-Ray Absolute Calibration of the Time Response of a Silicon Photodiode.” Applied Optics 41 (25): 5209. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.91211001&authtype=sso&custid=ns315887.