'Integrated Circuit Die Test Architecture' in Patent Application Approval Process (USPTO 20240345154)

Source :: Politics & Government Week. November 7, 2024, 2346
Publication Year :: 2024
Abstract: 2024 NOV 7 (VerticalNews) -- By a News Reporter-Staff News Editor at Politics & Government Week -- A patent application by the inventor Whetsel, Lee D. (Parker, TX, US), filed [...]

Subjects :: Integrated circuits -- Intellectual property
Circuit components -- Intellectual property
Semiconductor chips -- Intellectual property
Standard IC
Semiconductor device
Government
Political science

Tools