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A microwave broadband technique to measure the complex resistivity of HTS thin films

Authors :
Tosoratti, Nevio
Fastampa, Renato
Giura, Maurizio
Lenzi, Vasco
Sarti, Stafano
Silva, Enrico
Source :
IEEE Transactions on Applied Superconductivity. March, 2001, Vol. 11 Issue 1, p3082, 4 p.
Publication Year :
2001

Abstract

A new microwave broadband method for measuring the complex resistivity of high temperature superconducting thin films is proposed.

Details

ISSN :
10518223
Volume :
11
Issue :
1
Database :
Gale General OneFile
Journal :
IEEE Transactions on Applied Superconductivity
Publication Type :
Academic Journal
Accession number :
edsgcl.78631168