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Findings in Applied Sciences Reported from University of Electronic Science and Technology of China (Enhanced YOLOv8 with BiFPN-SimAM for Precise Defect Detection in Miniature Capacitors)

Source :
Science Letter. January 26, 2024, 198
Publication Year :
2024

Abstract

2024 JAN 26 (NewsRx) -- By a News Reporter-Staff News Editor at Science Letter -- Investigators discuss new findings in applied sciences. According to news originating from Chengdu, People's Republic [...]

Details

Language :
English
ISSN :
15389111
Database :
Gale General OneFile
Journal :
Science Letter
Publication Type :
News
Accession number :
edsgcl.779971141