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Trap engineering in organic hole transport materials

Authors :
von Malm, N.
Steiger, J.
Schmechel, R.
von Seggem, H.
Source :
Journal of Applied Physics. May 15, 2001, Vol. 89 Issue 10, p5559, 5 p.
Publication Year :
2001

Abstract

Research describing the influence of impurities on the electronic properties of hole transport layers is presented. Trap levels, transport properties and luminescence of organic light emitting devices are examined.

Details

ISSN :
00218979
Volume :
89
Issue :
10
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.76510596