Cite
Electrical and structural characterization of metal-oxide-semiconductor capacitors with silicon rich oxide
MLA
Crupi, I., et al. “Electrical and Structural Characterization of Metal-Oxide-Semiconductor Capacitors with Silicon Rich Oxide.” Journal of Applied Physics, vol. 89, no. 10, May 2001, p. 5552. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.76510595&authtype=sso&custid=ns315887.
APA
Crupi, I., Lombardo, S., Spinella, C., Bongiorno, C., Liao, Y., Gerardi, C., Fazio, B., Vulpio, M., & Privitera, S. (2001). Electrical and structural characterization of metal-oxide-semiconductor capacitors with silicon rich oxide. Journal of Applied Physics, 89(10), 5552.
Chicago
Crupi, I., S. Lombardo, C. Spinella, C. Bongiorno, Y. Liao, C. Gerardi, B. Fazio, M. Vulpio, and S. Privitera. 2001. “Electrical and Structural Characterization of Metal-Oxide-Semiconductor Capacitors with Silicon Rich Oxide.” Journal of Applied Physics 89 (10): 5552. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.76510595&authtype=sso&custid=ns315887.