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Effects of annealing on Ti, Pd, and Ni/n-Al0.11Ga0.89N Schottky diodes

Authors :
Arulkumaran, S.
Egawa, T.
Ishikawa, H.
Umeno, M.
Jimbo, Takashi
Source :
IEEE Transactions on Electron Devices. March, 2001, Vol. 48 Issue 3, p573, 8 p.
Publication Year :
2001

Abstract

A new study investigates the annealing effect of Schottky contacts on Pd, Ti and Ni/n-Al0.11Ga0.89 diodes.

Details

ISSN :
00189383
Volume :
48
Issue :
3
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.75199162