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Analysis of Single-Event Effects in Combinational Logic--Simulation of the AM2901 Bitslice Processor

Authors :
Massengill, L. W.
Baranski, A. E.
Van Nort, D. O.
Meng, J.
Bhuva, B. L.
Source :
IEEE Transactions on Nuclear Science. Dec, 2000, Vol. 47 Issue 6, 2609
Publication Year :
2000

Abstract

Using SEUTool (a synthesized VHDL based simulator of single-event fault propagation in combinational circuitry), we have performed a single-event study on a custom-designed CMOS AM2901, a 4-bit bit-slice processor. Analysis shows interesting general trends for single-event upset effects in complex combinational/sequential circuits.

Details

ISSN :
00189499
Volume :
47
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.72051758