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Analysis of Single-Event Effects in Combinational Logic--Simulation of the AM2901 Bitslice Processor
- Source :
- IEEE Transactions on Nuclear Science. Dec, 2000, Vol. 47 Issue 6, 2609
- Publication Year :
- 2000
-
Abstract
- Using SEUTool (a synthesized VHDL based simulator of single-event fault propagation in combinational circuitry), we have performed a single-event study on a custom-designed CMOS AM2901, a 4-bit bit-slice processor. Analysis shows interesting general trends for single-event upset effects in complex combinational/sequential circuits.
Details
- ISSN :
- 00189499
- Volume :
- 47
- Issue :
- 6
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.72051758