Total Dose Radiation Response and High Temperature Imprint Characteristics of Chalcogenide Based RAM Resistor Elements

Authors :: Bernacki, Steve
Hunt, Ken
Tyson, Scott
Hudgens, Steve
Pashmakov, Boil
Czubatyj, Wally
Source :: IEEE Transactions on Nuclear Science. Dec, 2000, Vol. 47 Issue 6, 2528
Publication Year :: 2000
Abstract: Chalcogenide thin film resistor elements are being integrated with CMOS structures for nonvolatile memory applications. This paper reports on the first total dose and imprint data published on this new technology demonstrating no observable effects on chalcogenide films after exposure to 1 Mrad(Si) and 125 [degrees] C temperature.

Subjects :: Nuclear research -- Observations
Thin layer chromatography -- Research
Chromatographic analysis -- Research
Business
Electronics
Electronics and electrical industries

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