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A functional testing method for microprocessors

Authors :
Shen, Li
Su, Stephen Y.H.
Source :
IEEE Transactions on Computers. Oct, 1988, Vol. v37 Issue n10, p1288, 6 p.
Publication Year :
1988

Subjects

Subjects :
Microprocessor
Systems Analysis
Testing
Failure Analysis
Sequential Processing
Very-Large-Scale Integration

Details

ISSN :
00189340
Volume :
v37
Issue :
n10
Database :
Gale General OneFile
Journal :
IEEE Transactions on Computers
Publication Type :
Academic Journal
Accession number :
edsgcl.7059333

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