Separation of effects of statistical impurity number fluctuations and position distribution on Vth fluctuation in scales MOSFETs

Subjects

Subjects :

Charge transfer -- Research
Electrical engineering -- Research
Metal oxide semiconductor field effect transistors -- Research
Statistical mechanics -- Research
Business
Electronics
Electronics and electrical industries

Details

ISSN :

00189383

Volume :

47

Issue :

10

Database :

Gale General OneFile

Journal :

IEEE Transactions on Electron Devices

Publication Type :

Academic Journal

Accession number :

edsgcl.69666665