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New Metrology Findings from Hefei University of Technology Reported (Development and Verification of a High-precision Laser Measurement System for Straightness and Parallelism Measurement)
- Source :
- Electronics Newsweekly. March 8, 2022, 472
- Publication Year :
- 2022
-
Abstract
- 2022 MAR 8 (VerticalNews) -- By a News Reporter-Staff News Editor at Electronics Newsweekly -- Current study results on Metrology have been published. According to news originating from Hefei, People's [...]
Details
- Language :
- English
- ISSN :
- 19441630
- Database :
- Gale General OneFile
- Journal :
- Electronics Newsweekly
- Publication Type :
- News
- Accession number :
- edsgcl.695869259