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Fracture Mechanics Analysis of Low Cost Solder Bumped Flip Chip Assemblies With Imperfect Underfills

Authors :
Lau, John H.
Lee, S.-W. Ricky
Source :
Journal of Electronic Packaging. Dec, 2000, Vol. 122 Issue 4, 306
Publication Year :
2000

Abstract

Solder joint reliability of flip chip on various thickness of printed circuit board with imperfect underfill is presented in this study. Emphasis is placed on the determination of the temperature-dependent stress and plastic strain at the corner solder joint with different crack (delamination) lengths. Also, the strain energy release rate and phase angle at the crack tip of the interface between the underfill and solder mask are obtained by fracture mechanics. [S1043-7398(00)01104-X]

Details

ISSN :
10437398
Volume :
122
Issue :
4
Database :
Gale General OneFile
Journal :
Journal of Electronic Packaging
Publication Type :
Academic Journal
Accession number :
edsgcl.69058424